iSixSigma

Birajashis Pattnaik

Forum Replies Created

Forum Replies Created

Viewing 3 posts - 1 through 3 (of 3 total)
  • Author
    Posts
  • #96866

    Birajashis Pattnaik
    Participant

    Another MPCI can be based on yield index suggested by Boyels R.A,  refered as Spk.. Check a technical paper presented by K.S Chen, W.L.Pern, and P.C.Lin named ” Capability measures for Process with Multiple Characteristics” in QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL.
    Birajashis Pattnaik

    0
    #96865

    Birajashis Pattnaik
    Participant

    Dear Andy,I am sorry that I could not respond you in time. Actually I am busy these days in one of my Seminar. Anyway I fell good to get some suggetion from you. These days I am doing less works on application of PCA and PLS to chemometric data. I will look into Reigle’s tolerancing example that you have suggested for. MPCI suggested by Taam, Subbaiah, and Liddy i.e. MCpm, I am interested in. Can we find out a good estmate of that in proper form to find out the bias and mean square error of that index?Thanks that you like my page and the melody in that.You are allways welcome for discussion and I will appreciate your suggetion.Thank youBirajashis Pattnaik

    0
    #95307

    Birajashis Pattnaik
    Participant

    You can also refer the MPCI proposed by K.S Pern,W.L.Pern and P.C.Lin(2003)
    Mail me [email protected]

    0
Viewing 3 posts - 1 through 3 (of 3 total)