Birajashis Pattnaik

Another MPCI can be based on yield index suggested by Boyels R.A,  refered as Spk.. Check a technical paper presented by K.S Chen, W.L.Pern, and P.C.Lin named ” Capability measures for Process with Multiple Characteristics” in QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL.
Birajashis Pattnaik

Dear Andy,I am sorry that I could not respond you in time. Actually I am busy these days in one of my Seminar. Anyway I fell good to get some suggetion from you. These days I am doing less works on application of PCA and PLS to chemometric data. I will look into Reigle’s tolerancing example that you have suggested for. MPCI suggested by Taam,…[Read more]

You can also refer the MPCI proposed by K.S Pern,W.L.Pern and P.C.Lin(2003)
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